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RaySeries measurement software

RaySeries measurement software

Rays-ON is the dedicated measurement software for WEVE’s Ray Series Raman systems. Designed for MantaRay, MobulaRay, and StingRay, it provides the essential functions required for Raman measurements through an intuitive, user-friendly interface. |
Key Software Features
Self-Diagnostic Function
Automatically checks the connection and status of key components at startup to ensure the system is ready for measurement.
| Raman Laser | Spectrograph CCD |
| Gratings | Motorized stage |
User-Friendly Interface
A clean, intuitive interface focused on essential functions for faster and easier operation.
| *Home | Spectrum |
| Scanning | Mapping |
| Polarimetry | Gallery |
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![]() | Autofocus Automatically adjusts the sample position based on the microscope image and quickly moves the objective lens to the optimal focus position. |
Real-time Z-axis Tracking
Tracks and visualizes the sample’s 3D surface in real time before mapping to generate a Z-height map.
Autofocus Map image
View the resulting image directly in the WeVu analysis software.
![]() | Guide Beam & Distance Measurement View the microscope image and laser position at the same time, making it easy to align the measurement point and position the sample accurately.
- Adjust the measurement position - Verify the laser position - Measure distances |
![]() | Measurement Modes Choose from multiple measurement modes to suit different sample conditions and experiments.
- Single / Real-time measurement - Accumulation (Sum / Average) - Kinetics per time and depth |
Peak Detection & Background Subtraction
View peak information in real time and remove background signals from measured spectra.
- Peak detection
- Background removal
ROI Analysis Set regions of interest (ROI) within the measured spectrum to view and analyze key signal information in real time.
- Single-axis ROI scan (X, Y & Z) - Multipoint scan - Time-based kinetics | ![]() |
Automatic Spectrometer Calibration Automatically recalibrates the system when measurement conditions change, such as the laser, grating, or Raman shift range, helping maintain optimized Raman measurements.
- Spectrometer calibration - Rayleigh calibration - Raman shift range adjustment | ![]() |
Multipoint scan Select multiple positions on the sample image for sequential automatic measurement.
- Single axis ( X & Y & Z ) scan - Multipoint scan | ![]() |
Segment mapping Define regions with similar characteristics based on color and boundaries in the microscope image, then generate mapping images only for the selected areas. This helps speed up analysis of large or irregularly shaped samples. | ![]() |
High-speed 2D and 3D mapping based on stage movement, with real-time visualization of measurement data.
- 2D mapping & 3D mapping
- Mapping data visualization
Automated polarization control hardware and software provide precise control of the laser polarization. By detecting subtle polarization changes from the sample, the system enables high-resolution analysis of optical properties.
- Software-controlled polarization
- Motorized polarizer / Analyzer
Polarization control with Rays-On
Polar Plot of the Selected Signal
Control polarization of laser
Gallery: Data, Image save Rays-ON lets you save microscope images and measurement spectra together. Saved results can be viewed as a list in the Gallery, with thumbnail previews for both images and spectra. Select the data you need and export or save it for further use. | ![]() |
Experience with WEVE's solutions. Use Contacts to get in touch anytime.
A. 33, Sagimakgol-ro 62beon-gil, Seongnam-si, Gyeonggi-do, Republic of Korea (13211).
T. 031 548 2990 F. 031 548 2991
©2023 WEVE Co., Ltd all right reserved
Have questions or need assistance?
Contact us at your convenience.
A. 33, Sagimakgol-ro 62beon-gil, Seongnam-si, Gyeonggi-do, Republic of Korea (13211).
T. +82 031 548 2990 F. +82 031 548 2991
©2023 WEVE Co., Ltd all right reserved.