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RaySeries measurement software 


 RaySeries measurement software 


Rays-ON is the dedicated measurement software for WEVE’s Ray Series Raman systems.

Designed for MantaRay, MobulaRay, and StingRay, it provides the essential functions required for Raman measurements through an intuitive, user-friendly interface.






Key Software Features

Self-Diagnostic Function 


Automatically checks the connection and status of key components at startup to ensure the system is ready for measurement. 


Raman LaserSpectrograph CCD
GratingsMotorized stage

User-Friendly Interface


A clean, intuitive interface focused on essential functions for faster and easier operation.

 

*HomeSpectrum
Scanning
Mapping
PolarimetryGallery



 
Easy Sample Positioning 

Use the mouse directly on the microscope image to move the sample in XY and adjust focus along the Z-axis.

- Move to and save sample positions (XYZ)
- Measure distances 
- Compensate for objective FOV differences
 
Autofocus   


Automatically adjusts the sample position based on the microscope image and quickly moves the objective lens to the optimal focus position. 

Real-time Z-axis Tracking
 
Tracks and visualizes the sample’s 3D surface in real time before mapping to generate a Z-height map.

Autofocus Map image

 

View the resulting image directly in the WeVu analysis software.

                                                     


 
Guide Beam & Distance Measurement 


View the microscope image and laser position at the same time, making it easy to align the measurement point and position the sample accurately. 

 

- Adjust the measurement position 

- Verify the laser position

- Measure distances 
 
Measurement Modes 


Choose from multiple measurement modes to suit different sample conditions and experiments. 

 

- Single / Real-time measurement 

- Accumulation (Sum / Average)

- Kinetics per time and depth

Peak Detection & Background Subtraction 


View peak information in real time and remove background signals from measured spectra.

- Peak detection 

- Background removal 


ROI Analysis   


Set regions of interest (ROI) within the measured spectrum to view and analyze key signal information in real time. 

 

- Single-axis ROI scan (X, Y & Z)

- Multipoint scan 

- Time-based kinetics 
 
Automatic Spectrometer Calibration 


Automatically recalibrates the system when measurement conditions change, such as the laser, grating, or Raman shift range, helping maintain optimized Raman measurements. 

 

- Spectrometer calibration

- Rayleigh calibration 

- Raman shift range adjustment 
 
Multipoint scan


Select multiple positions on the sample image for sequential automatic measurement. 

 

- Single axis ( X & Y & Z ) scan

- Multipoint scan

 
Segment mapping


Define regions with similar characteristics based on color and boundaries in the microscope image, then generate mapping images only for the selected areas. This helps speed up analysis of large or irregularly shaped samples. 

 

2D & 3D fast mapping


High-speed 2D and 3D mapping based on stage movement, with real-time visualization of measurement data. 


- 2D mapping & 3D mapping

- Mapping data visualization

Polarimetry 


Automated polarization control hardware and software provide precise control of the laser polarization. By detecting subtle polarization changes from the sample, the system enables high-resolution analysis of optical properties. 


- Software-controlled polarization 

- Motorized polarizer / Analyzer


Gallery: Data, Image save 


Rays-ON lets you save microscope images and measurement spectra together. Saved results can be viewed as a list in the Gallery, with thumbnail previews for both images and spectra. Select the data you need and export or save it for further use. 

 


Experience with WEVE's solutions. Use Contacts to get in touch anytime.


A. 33, Sagimakgol-ro 62beon-gil, Seongnam-si, Gyeonggi-do, Republic of Korea (13211).


T. 031 548 2990  F. 031 548 2991

M. weve@theweve.com





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