Contactless and non-disruptive inspection technology of WEVE provides highly accurate and rapid analysis of analysis of  wafers. 

• Spectral Information 
  Resolution 100 ㎛.

• High-speed measurement
  200,000+ spectrum data points per second.

• High resolution
  World class level of accuracy.

• Simultaneous PL and Appearance Inspection
  Outstanding efficiency in one scan.

WEVE technology speeds up scanning process 3000 times compared to the conventional inspection methods, which seriously reduces processing time and increases overall cost effectiveness.

With only one measurement Appearance, PL and Luminous Intensity data of Micro LED can be obtained.

General Specifications 

Spectral Mapper

Industry leading inspection speed.

Due to the growing demand of Micro LEDs in display manufacturing, sophisticated inspection techniques are needed. Outdated PL mapper technology cannot keep up with an increased number of Micro LED die.  

High-speed measurement performance.

High-speed Spectrum

Imaging Technology.

Analysis of Spectral Data.

Wafer’s high-definition spectrum imaging data guarantees improvements in data analysis of Micro LED’s color expression.

• - Peak wavelength 
• - Full width at half maximum  
  
  
  

Mapping Spectrum Imaging.

Micro LED Solution 

R&D History.