- Industrial - Micro LED
Contactless and non-disruptive inspection technology of WEVE provides highly accurate and rapid analysis of wafers of all types.
WEVE technology speeds up scanning process 3000 times compared to the conventional inspection methods, which seriously reduces processing time and increases overall cost effectiveness.
With only one measurement Appearance, PL and Luminous Intensity data of Micro LED can be obtained.
Industry leading inspection speed.
Due to the growing demand of Micro LEDs in display manufacturing, sophisticated inspection techniques are needed. Outdated PL mapper technology cannot keep up with an increased number of Micro LED die. With our technology spectrum of 20,000 points can be measured in one second.
High-speed measurement performance.
Analysis of Spectral Data.
Wafer’s high-definition spectrum imaging data guarantees improvements in data analysis of Micro LED’s color expression.
Mapping Spectrum Imaging.
Micro LED Solution
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